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Silicon-nonaqueous solution interface studied by capacitance-voltage and conductance-voltage techniques

Hikaru Kobayashi, Nobuteru Takeda, Hiroshi Sugahara, Hiroshi Tsubomura
DOI: 10.1021/j100155a061
The Journal of Physical Chemistry

Data up to Jan 2025

Published1991
Citations17
References0
Fields
Materials scienceChemistryEngineeringPhysicsOptoelectronicsElectrical engineeringChromatography

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