Quantitative analysis of silicates by ion microprobe

Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets

1969 • 3,398 citations

Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides

1968 • 2,157 citations

スパッタの理論 I 非晶質のスパッタ収量と多結晶ターゲット

1969 • 1,970 citations

LEAST-SQUARES FITTING OF A STRAIGHT LINE

1966 • 1,491 citations

Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectra

1973 • 432 citations

The sputtering process and sputtered ion emission

1979 • 323 citations

Applications of the Ion Microprobe to Geochemistry and Cosmochemistry

1982 • 271 citations

Geochemical applications of quantitative ion-microprobe analysis

1978 • 263 citations

A quantum-mechanical model for the ionization and excitation of atoms during sputtering

1973 • 187 citations

Clinopyroxene-matrix partitioning of K, Rb, Cs, Sr and Ba

1974 • 178 citations

Isotope fractionation in secondary ion mass spectrometry

1982 • 159 citations

Observation of clusters in a sputtering ion source

1973 • 97 citations

Geochemistry of ultramafic inclusions from Salt Lake Crater, Hawaii, and from Southern African kimberlites

1975 • 58 citations

MINOR AND TRACE ELEMENTS IN AUGITE, HORNBLENDE, AND PYROPE MEGACRYSTS FROM KAKANUI, NEW ZELAND

1973 • 44 citations

A quantitative model for the interpretation of secondary ion mass spectra of dilute alloys

1975 • 39 citations

Quantitative ion probe analysis of glasses by empirical calibration methods

1978 • 22 citations