Instrumental Aspects of Spatially 3-Dimensional SIMS Analysis

Evaluation of a cesium positive ion source for secondary ion mass spectrometry

1977 • 340 citations

Ion implantation for in-situ quantitative ion microprobe analysis

1980 • 99 citations

Applied charged particle optics

1981 • 90 citations

Ion probe microanalysis

1975 • 58 citations

Direct digitization system for quantification in ion microscopy

1980 • 57 citations

Quantitation of secondary ion mass spectrometric images by microphotodensitometry and digital image processing

1977 • 51 citations

High-performance secondary ion mass spectrometer

1980 • 47 citations

A quantitative model for the interpretation of secondary ion mass spectra of dilute alloys

1975 • 39 citations

Digital image processing for image quantification in ion microscope analysis

1980 • 29 citations

Some basic considerations concerning the sensitivity of sputter ion mass spectrometers

1971 • 27 citations

Evaluation of several semi-theoretical methods for quantitative secondary ion mass spectrometric analysis after discrimination-correction of data

1979 • 25 citations

Determination of elemental concentration maps from digital secondary ion images

1979 • 22 citations

On quantifying images of element distributions obtained with an ion microprobe

1978 • 13 citations

Sims applications in the investigation of surfaces, thin films and sandwich structures, with speical regard to quantitative analyses

1976 • 9 citations

Ionen-Mikrosonden-Analysatoren

1973 • 2 citations